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Influence of channel layer thickness on the electrical performances of inkjet-printed In-Ga-Zn oxide thin-film transistors

机译:沟道层厚度对喷墨印刷In-Ga-Zn氧化物薄膜晶体管电性能的影响

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摘要

Inkjet-printed In-Ga-Zn oxide (IGZO) thin-film transistors (TFTs) with bottom-gate bottom-contact device architecture are studied in this paper. The impact of the IGZO film thickness on the performance of TFTs is investigated. The threshold voltage, field-effect mobility, on and off drain current, and subthreshold swing are strongly affected by the thickness of the IGZO film. With the increase in film thickness, the threshold voltage shifted from positive to negative, which is related to the depletion layer formed by the oxygen absorbed on the surface. The field-effect mobility is affected by the film surface roughness, which is thickness dependent. Our results show that there is an optimum IGZO thickness, which ensures the best TFT electrical performance. The best result is from a 55-nm-thick IGZO TFT, which showed a field-effect mobility in the saturation region of 1.41 2V ·, a threshold voltage of 1 V, a drain current on/off ratio of approximately 4.3 × 107, a subthreshold swing of 384 mV/dec, and an off-current level lower than 1 pA. © 2006 IEEE.
机译:本文研究了具有底栅底部接触器件架构的喷墨印刷的In-Ga-Zn氧化物(IGZO)薄膜晶体管(TFT)。研究了IGZO膜厚度对TFT性能的影响。阈值电压,场效应迁移率,漏极开/关电流以及亚阈值摆幅受IGZO膜厚度的很大影响。随着膜厚度的增加,阈值电压从正变为负,这与由表面上吸收的氧形成的耗尽层有关。场效应迁移率受薄膜表面粗糙度的影响,薄膜表面粗糙度取决于厚度。我们的结果表明,存在最佳的IGZO厚度,可确保最佳的TFT电气性能。最好的结果来自厚度为55 nm的IGZO TFT,该晶体管的饱和场效应迁移率为1.41 2V·,阈值电压为1 V,漏极电流开/关比约为4.3×107,亚阈值摆幅为384 mV / dec,关断电流低于1 pA。 ©2006 IEEE。

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